Author:
Yalcin M. Cihan,Yenigun Husnu
Publisher
Springer Berlin Heidelberg
Reference14 articles.
1. Prentice Hall International Editions;A.S. Tanenbaum,1996
2. Gill, A.: Introduction to the Theory of Finite–State Machines. McGraw-Hill, New York (1962)
3. Hennie, F.C.: Fault–detecting experiments for sequential circuits. In: Proceedings of Fifth Annual Symposium on Switching Circuit Theory and Logical Design, Princeton, New Jersey, pp. 95–110 (1964)
4. Lee, D., Yannakakis, M.: Principles and methods of testing finite–state machines – a survey. Proceedings of the IEEE 84(8), 1089–1123 (1996)
5. Sabnani, K., Dahbura, A.: A protocol test generation procedure. Computer Networks 15, 285–297 (1988)
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