Quantitative surface photovoltage spectroscopy of semiconductor interfaces-Reference-Cited by-同舟云学术

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Quantitative surface photovoltage spectroscopy of semiconductor interfaces

Published:1995-04 Issue:4 Volume:24 Page:379-385
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:JEM

Author:

Kronik L.,Leibovitch M.,Fefer E.,Burstein L.,Shapira Yoram

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/BF02659702.pdf

Reference31 articles.

1. S.M. Sze,Physics of Semiconductor Devices (New York: Wiley, 1985).

2. F. Capasso and G. Margaritondo, eds.,Herojunction Band Discontinuities (Amsterdam: North-Holland, 1987), and ref- erences therein.

3. D.K. Schroder,Semiconductor Materials andDevice Charac- terization (New York: Wiley, 1990).

4. H. Deuling, E. Klausmann and A. Goetzberger,Sol. State Elect. 15,559(1973).

5. J. Lagowski, C. L. Balestra and H. C. Gatos,Surf. Sci. 29,203 (1972).

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