1. Anand, S., Burke, E.K., Chen, T.Y., Clark, J., Cohen, M.B., Grieskamp, W., Harman, M., Harrold, M.J., McMinn, P.: An orchestrated survey of methodologies for automated software test case generation. J. Syst. Softw. 86(8), 1978–2001 (2013)
2. Bochmann, G.V., Das, A., Dssouli, R., Dubuc, M., Ghedamsi, A., Luo, G.: Fault models in testing. In: Proceedings of the IFIP TC6/WG6. 1 Fourth International Workshop on Protocol Test Systems, vol. IV, pp. 17–30. North-Holland Publishing Co. (1991)
3. Cheng, K.T., Krishnakumar, A.S.: Automatic functional test generation using the extended finite state machine model. In: Proceedings of 30th Design Automation Conference, pp. 86–91 (1993)
4. Chow, T.S.: Testing software design modeled by finite-state machines. IEEE Trans. Softw. Eng. 4(3), 178–187 (1978)
5. Chun, W., Amer, P.D.L.: Test case generation for protocols specified in Estelle. In: Proceedings of the IFIP TC6/WG6. 1 Third International Conference on Formal Description Techniques for Distributed Systems and Communication Protocols: Formal Description Techniques, vol. III, pp. 191–206. North-Holland Publishing Co (1990)