SIMS yields from glasses; secondary ion energy dependence and mass fractionation-Reference-Cited by-同舟云学术

SIMS yields from glasses; secondary ion energy dependence and mass fractionation

Published:1987-01 Issue:1-6 Volume:91 Page:387-400
ISSN:0026-3672
Container-title:Mikrochimica Acta
language:en
Short-container-title:Mikrochim Acta

Author:

Urban Engstr�m E.,Lodding Alexander,Odelius Hans,S�dervall Ulf

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF01199515.pdf

Reference29 articles.

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3. J. C. Lorin, A. Havette, G. Slodzian, in:SIMS III (Springer Ser. Chem. Phys., Vol. 19), (A. Benninghoven, J. Giber, J. L�szl�, M. Riedel, H. W. Werner, eds.), Springer, Berlin-Heidelberg-New York, 1982, p. 140.

4. U. S�dervall, H. Odelius, A. Lodding, G. Frohberg, K. H. Kraatz, H. Wever, inSIMS V (Springer Ser. Chem. Phys. Vol. 44), (A. Benninghoven, R. L. Colton, D. S. Simons, H. W. Werner, eds.), Springer, Berlin-Heidelberg-New York-Tokyo, 1986, p. 41.

5. J. M. Rouberol, M. Lepareur, B. Autier, J. M. Gourgout, in:X-ray Optics and Microanalysis (D. R. Beaman, R. E. Ogilvie, D. B. Wittry, eds.), Pendell, Midland, MI, 1980.

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