Blunting of cracks of intermediate states of stress by scanning electron microscopy-Reference-Cited by-同舟云学术

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Blunting of cracks of intermediate states of stress by scanning electron microscopy

Published:1989-03 Issue:3 Volume:24 Page:1121-1127
ISSN:0022-2461
Container-title:Journal of Materials Science
language:en
Short-container-title:J Mater Sci

Author:

Theocaris P. S.,Kytopoulos V.,Stassinakis C.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF01148808.pdf

Reference24 articles.

1. ASTM STP 514;J. A. Begley,1972

2. A. A. Wells, ?Crack Propagation Symposium?, College of Aeronautics, Cranfield, 1, (1961) p. 210.

3. C. G. Chipperfield,Int. J. Fract.,12 (1976) 873.

4. P. S. Theocaris,J. Strain Analysis 9 (1974) 197.

5. J. R. Rice andM. A. Johnson,Inelastic Behaviour of Solids (1970) 641.

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1. Non linear fracture mechanics of polymers: Load Separation and Normalization methods;Engineering Fracture Mechanics;2012-01

2. Visualization of crack blunting using secondary fluorescence in soft polymers;Polymer Testing;2008-06

3. Real time study of failure events in polymers;Journal of Materials Science;1995-04

4. Investigation by scanning electron microscope of the effect of geometry and loading mode on blunting of copper sheets;Journal of Materials Science;1992

5. Crack tip opening and advance displacements of blunted cracks under plane stress;Journal of Materials Science;1991-01-01

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