Transistor-Level Based Defect-Tolerance for Reliable Nanoelectronics
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Publisher
Springer Netherlands
Link
http://link.springer.com/content/pdf/10.1007/978-90-481-8540-5_3.pdf
Reference46 articles.
1. M. Butts, A. DeHon, and S. C. Goldstein, “Molecular electronics: devices, systems and tools for gigagate, gigabit chips,” In ICCAD, pages 433–440, 2002.
2. T. N. A. Bachtold, P. Harley and C. Dekker, “Logic circuits with carbon nanotube transistors,” Science, 294:1317–1320, 2001.
3. Y. Cui and C. M. Lieber, “Functional nanoscale electronic devices assembled using silicon nanowire building blocks,” Science, 291:851–853, 2001.
4. Y. Huang, “Logic gates and computation from assembled nanowire building blocks,” Science, 294:1313–1317, 2001.
5. P. D. Tougaw and C. S. Lent. “Logical devices implemented using quantum cellular automata,” J. Applied Physics, 75:1818–1825, 1994.
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