1. M. Abramovici, E. Lee and C. Stroud, “BIST-Based Diagnostics for FPGA Logic Blocks,” in Proc. Int. Test Conf. (ITC’97), pp. 539–547, 1997.
2. J. G. Brown and R. D. S. Blanton, “CAEN-BIST: Testing the Nanofabrics,” in Proc. Int. Test Conf. (ITC’04), pp. 462–471, 2004.
3. J. R. S. Brown, R. Francis and Z. Vranesic, “Field Programmable Gate Arrays,” Kluwer, 1992.
4. M. Butts, A. Dehon and S. C. Goldstein, “Molecular Electronics: Devices, Systems and Tools for Gigagate, Gigabit Chips,” in Proc. IEEE Int. Conf. on Computer-Aided Design (ICCAD’02), pp. 433–440, 2002.
5. C. P. Collier, E. W. wong, M. Belohradsky, F. M. raymo, J. F. Stoddart, P. J. Kuekes, R. S. Williams and J. R. heath, “Electronically Configurable Molecular-Based Logic Gates,” Science, vol. 285, pp. 391, July 1999.