Multielement ultratrace analysis in tungsten using secondary ion mass spectrometry

Author:

Wilhartitz P.,Virag A.,Friedbacher G.,Grasserbauer M.,Ortner H. M.

Publisher

Springer Science and Business Media LLC

Subject

Clinical Biochemistry,General Materials Science,General Medicine,Analytical Chemistry

Reference18 articles.

1. VG Instruments; Technical Information GD010; Pub 02.683 Feb 86 RWP/Graphic Design; Winsford, Cheshire, 1986

2. Mori N, Kambara S (1984) Amax Symposium: Physical metallurgy and technology of Mo and its alloys. November

3. Ortner HM (1983) Techniques for bulk chemical analysis. Part 1. Trace analysis of refractory metals. In: Van der Biest O (ed) Analysis of high temperature materials. Applied Science Publishers, London New York

4. Grasserbauer M, Wilhartitz P, Ortner HM, Kny E (1987) Contribution of secondary ion mass spectrometry (SIMS) to the chemical characterization of hard and refractory metals. Part I, Part II, Part III. Int Refractory Hard Metals 5:30, 88, 136

5. Sastri CS, Caletka R, Krivan V (1980) J Radioanal Chem 70:273–285

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