Chemometrics-aided RBS analysis of thin films-Reference-Cited by-同舟云学术

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Chemometrics-aided RBS analysis of thin films

Published:1991 Issue:5-6 Volume:341 Page:325-331
ISSN:0937-0633
Container-title:Fresenius' Journal of Analytical Chemistry
language:en
Short-container-title:Fresenius J Anal Chem

Author:

Liebich V.,Gr�tzschel R.

Publisher

Springer Science and Business Media LLC

Subject

Biochemistry,Analytical Chemistry,Biochemistry

Link

http://link.springer.com/content/pdf/10.1007/BF00321928.pdf

Reference18 articles.

1. Chu WK, Mayer JW, Nicolet MA (1978) Backscattering spectrometry. Academic Press, New York

2. Massart DL, Vandeginste BGM, Deming SN, Michotte Y, Kaufman L (1988) Chemometrics: a Textbook. Elsevier, Amsterdam

3. Sharaf MA, Illman DL, Kowalski BR (1986) Chemometrics. Wiley, New York Chichester

4. Grötzschel R (1985) ZfK-Ber 559:176

5. Doolittle LR (1986) Nucl Instrum Methods B15:227?231

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2. Characterisation of the chemical homogeneity of solid-state materials by chemometric methods: Further multivariate aspects;Fresenius' Journal of Analytical Chemistry;1995

3. Chemometric evaluation of inhomogeneity in thin metallic strips;Chemometrics and Intelligent Laboratory Systems;1994-08

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