Author:
Wang Yongqiang,Lou Wenzhong,Fan Ningjun,Hao Jianwei,Zhang Dayin
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference10 articles.
1. Benjamin C, Yoshio M, Yamato F, Tadashi S, Hiroyuki F (2006) A highly simple failure detection method for electrostatic microactuators: application to automatic testing and accelerated lifetime estimation. IEEE Trans Semiconduct Manufact, vol 19, no 1
2. Jose VC, Marcelo SL (2003) Designing for test analog signal processors for MEMS-based inertial sensors. In: Proceedings of the 3rd IEEE international workshop on system-on-chip
3. Mir S, Charlot B, Courtois B (1999) Extending fault-based testing to microelectromechanical systems, Test Workshop 1999, Proceedings, European.
4. Rosing R, Richardson A, Dorey A, Peyton A (1999) Fault simulation for MEMS, intelligent and self-validating sensors (Ref. No. 1999/160), IEE Colloquium
5. Rosing R, Lechner A, Richardson A, Dorey A (2000) Fault simulation and modelling of microelectromechanical systems. IEEE Comput Control Eng
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