Author:
He Y.,Zhang H.,Mitsuya Y.,Fukuzawa K.
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference18 articles.
1. Clegg W, Liu X, Liu B, Li A, Chong C, Jenkins D (2001) Normal incidence polarization interferometry flying height testing. IEEE Trans Magn 37(4):1941–1943
2. Duran CA (1996) Error analysis of a multiwavelength dynamic flying height tester. IEEE Trans Magn 32(5):3720–3722
3. Groot P, Deck L, Soobitsky J, Biegen J (1996) Polarization interference for measuring the flying height of magnetic read-write heads. Opt Lett 21(6):441–443
4. Lacey C (1994) Method and apparatus to calibrate intensity and determine fringe order for interferometric measurement of small spacings. US Patent #5,280,340
5. Li Y, Menon A (1996) Flying height measurement metrology for ultra-low spacing in rigid magnetic recording. IEEE Trans Magn 32:129–134
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