An investigation of the diffraction fields of plane inhomogeneities in a waveguide by means of metal-semiconductor film structures-Reference-Cited by-同舟云学术

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An investigation of the diffraction fields of plane inhomogeneities in a waveguide by means of metal-semiconductor film structures

Published:1970-10 Issue:10 Volume:13 Page:1179-1184
ISSN:0033-8443
Container-title:Radiophysics and Quantum Electronics
language:en
Short-container-title:Radiophys Quantum Electron

Author:

Vlasov B. I.,Kotosonov N. V.,Dronova V. S.,P'yanykh Yu. M.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Astronomy and Astrophysics,Nuclear and High Energy Physics,Statistical and Nonlinear Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/BF01031014.pdf

Reference8 articles.

1. N. B. Kotosonov and B. I. Vlasov, Izv. VUZ. Radiofiz.,11, No. 2, 311 (1968).

2. B. I. Vlasov, N. V. Kotosonov,B. D. Korchagin, and Yu. M. P'yanykh, Izv. VUZ. Radiofiz.,12, No. 8, 1222 (1969).

3. W. Harding, C. Hilsum, and D. Northrop,Nature,181, 691 (1958).

4. A. P. Bazhulin, E. A. Vinogradov, N. A. Irisova, and S. A. Fridman, Pis'ma Zh. Éksperim. Teor. Fiz.,8, No. 5, 261 (1968).

5. G. A. Yugova, Proceedings of the All-Union Scientific-Research Institute of Physicotechnical and Radiotechnical Measurements [in Russian], No. 80 (140), Standartgiz, Moscow (1966), p. 108.

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