Surface and volume decay processes in semiconductors studied by contactless transient photoconductivity measurements-Reference-Cited by-同舟云学术

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Surface and volume decay processes in semiconductors studied by contactless transient photoconductivity measurements

Published:1988-06 Issue:2 Volume:46 Page:77-85
ISSN:0721-7250
Container-title:Applied Physics A Solids and Surfaces
language:en
Short-container-title:Appl. Phys. A

Author:

Kunst M.,M�ller G.,Schmidt R.,Wetzel H.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry,Physics and Astronomy (miscellaneous),General Engineering,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00615912.pdf

Reference15 articles.

1. W. Shockley:Electrons and Holes in Semiconductors (Van Nostrand, New York 1950)

2. J.P. McKelvey, R.L. Longini: J. Appl. Phys.25, 634 (1954)

3. M. Kunst, G. Beck: J. Appl. Phys.60, 3558 (1986)

4. A. Many, Y. Goldstein, N.B. Grover:Semiconductor Surfaces (North-Holland, Amsterdam 1965)

5. D.R. Frankl:Electrical Properties of Semiconductor Surfaces (Pergamon, Oxford 1962)

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