Objective Bayesian analysis of degradation model with respect to a Wiener process

Author:

He Lei,He Daojiang,Cao Mingxiang

Publisher

Springer Science and Business Media LLC

Subject

Information Systems,Computer Science (miscellaneous)

Reference24 articles.

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2. Meeker W Q and Escobar L A, Statistical Methods for Reliability Data, John Wiley and Sons, New York, 1998.

3. Chao M T, Degradation analysis and related topics: Some thoughts and a review, Proceedings of the National Science Council, Part A, 1999, 23: 555–566.

4. Lu C J and Meeker W Q, Using degradation measures to estimate a time-to-failure distribution, Technometrics, 1993, 35: 161–174.

5. Robinson M E and Crowder M J, Bayesian methods for a growthcure degradation model with repeated measures, Lifetime Data Analysis, 2000, 6: 357–374.

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