Characteristics of the spectrum of IR radiation reflected by silicon diffusion layers with high charge-carrier densities-Reference-Cited by-同舟云学术

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Characteristics of the spectrum of IR radiation reflected by silicon diffusion layers with high charge-carrier densities

Published:1985-12 Issue:6 Volume:43 Page:1353-1355
ISSN:0021-9037
Container-title:Journal of Applied Spectroscopy
language:en
Short-container-title:J Appl Spectrosc

Author:

Baranov L. I.,Gusev Yu. Yu.

Publisher

Springer Science and Business Media LLC

Subject

Spectroscopy,Condensed Matter Physics

Link

http://link.springer.com/content/pdf/10.1007/BF00665306.pdf

Reference10 articles.

1. D. I. Bilenko, V. I. Evdokinov, N. P. Kazanova, et al., Fiz. Tekh. Poluprovodn.,5, No. 7, 1423?1427 (1971).

2. L. N. Strel'tsov and I. B. Khaibullin, Fiz. Tekh. Poluprovodn.,6, No. 3, 589 (1972).

3. Abe Toshio and Nishy Yoshio, Jpn. J. Appl. Phys.,7, No. 4, 397?403 (1968).

4. E. Barta, Hiradastechnika,21, No. 11, 343?346 (1970).

5. P. A. Shyman, Solid State Technol.,13, No. 1, 50?52 (1970).

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