Quantitative depth profile analysis of high-Tc-superconductors with sputtered neutral mass spectrometry (SNMS)-Reference-Cited by-同舟云学术

Quantitative depth profile analysis of high-Tc-superconductors with sputtered neutral mass spectrometry (SNMS)

Published:1989-01 Issue:4-5 Volume:333 Page:343-345
ISSN:0016-1152
Container-title:Fresenius' Zeitschrift für analytische Chemie
language:en
Short-container-title:Z. Anal. Chem.

Author:

Peters H.,Skoda L.,Crecelius G.,Adrian H.

Publisher

Springer Science and Business Media LLC

Subject

Clinical Biochemistry,General Materials Science,General Medicine,Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF00572324.pdf

Reference6 articles.

1. Davies AH, Tilley RJD (1987) Nature 326:859

2. Steiner P, Kinsinger V, Sander I, Siegerart D, Hüfner S, Politis C (1987) Z Phys B-Condensed Matter 67:19

3. Cava RJ, Batlogg B, Van Dover RB, Murphy DW, Sunshine S, Sigrist T, Espinosa JP (1987) Phys Rev Lett 58:1676

4. Oechsner H (1984) SNMS and its application to depth profile and interface analysis. Topics in current physics, vol 37. Springer, Berlin Heidelberg New York, pp 63–85

5. Müller KH, Seifert K, Wilmers M (1985) J Vac Sci Technol, p 1367

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