Infrared Femtosecond Laser Preionization in Secondary Ion Mass Spectrometry of Silver Surface-Reference-Cited by-同舟云学术

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Infrared Femtosecond Laser Preionization in Secondary Ion Mass Spectrometry of Silver Surface

Published:2012-05-01 Issue:7 Volume:23 Page:1266-1270
ISSN:1044-0305
Container-title:Journal of the American Society for Mass Spectrometry
language:en
Short-container-title:J. Am. Soc. Mass Spectrom.

Author:

Lorenc Dusan¹,Jane Eduard²,Stupavska Monika²,Jerigova Monika¹²,Velic Dusan¹²

Affiliation:

1. International Laser Centre, Ilkovicova 3, 841 04, Bratislava, Slovakia

2. Faculty of Natural Sciences, Comenius University, Mlynska dolina, 842 15, Bratislava, Slovakia

Publisher

American Chemical Society (ACS)

Subject

Spectroscopy,Structural Biology

Link

http://link.springer.com/content/pdf/10.1007/s13361-012-0390-2.pdf

Reference19 articles.

1. Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

2. Static secondary ion mass spectrometry (S-SIMS) Part 1: methodology and structural interpretation

3. Static secondary ion mass spectrometry (S-SIMS) Part 2: material science applications

4. Surface analysis by nonresonant multiphoton ionization of desorbed or sputtered species

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Two‐color symmetry breaking in laser‐based secondary neutral mass spectrometry;Rapid Communications in Mass Spectrometry;2020-07-29

2. Adaptive Control of Ion Yield in Femtosecond Laser Post-ionization for Secondary Ion Mass Spectrometry;Scientific Reports;2017-07-20

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