Characterization of oxide layers on copper by linear potential sweep voltammetry-Reference-Cited by-同舟云学术

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Characterization of oxide layers on copper by linear potential sweep voltammetry

Published:1986-05 Issue:3 Volume:16 Page:413-421
ISSN:0021-891X
Container-title:Journal of Applied Electrochemistry
language:en
Short-container-title:J Appl Electrochem

Author:

Deutscher R. L.,Woods R.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrochemistry,General Chemical Engineering

Link

http://link.springer.com/content/pdf/10.1007/BF01008852.pdf

Reference24 articles.

1. C. J. L. Booker and M. Salim,Nature, Phys. Sci. 239 (1972) 62.

2. T. Yamane, K. Hirao and S. Tatsumi,Shindo Gijutsu Kenkyukai 14 (1975) 114.

3. A. V. Kocherova, E. S. Golovina and T. S. Korotkova,Zavod. Lab. 42 (1972) 1353.

4. H. Pops and D. R. Hennessy,Wire J. 10 (1977) 50.

5. Z. B. Rozhdestvenskaya, V. B. Sigitov and O. A. Songina,J. Anal. Chem. USSR 34 (1979) 350.

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