New microwave system to determine the complex permittivity of small dielectric and semiconducting samples-Reference-Cited by-同舟云学术

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New microwave system to determine the complex permittivity of small dielectric and semiconducting samples

Published:1975-08 Issue:8 Volume:25 Page:916-926
ISSN:0011-4626
Container-title:Czechoslovak Journal of Physics
language:en
Short-container-title:Czech J Phys

Author:

Musil J.,Žáček F.,Bürger A.,Karlovský J.

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy

Link

http://link.springer.com/content/pdf/10.1007/BF01589309.pdf

Reference13 articles.

1. Handbook of Microwave Measurements. (Edited by M. Sucher and J. Fox.) Vol. II., chapter IX, Polytechnic Institute of Brooklyn, Wiley, N. Y. 1963.

2. Hippel A. R., Dielectric and Waves, Wiley, N. Y. 1954.

3. Jacobs H. et al., Proc. I.R.E.49 (1961), 928, Proc. IEEE51 (1963), 608.

4. Bhar J. N., Proc. IEEE51 (1963), 1623.

5. Champlin K. S., Armstrong D. B., Proc. I.R.E.50 (1962), 232.

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