Author:
Abad José M.,Tesio Alvaro Y.,Martínez-Periñán Emiliano,Pariente Félix,Lorenzo Encarnación
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,General Materials Science,Condensed Matter Physics,Atomic and Molecular Physics, and Optics
Reference57 articles.
1. Bard, A. J.; Fan, F. R. F.; Kwak, J.; Lev, O. Scanning electrochemical microscopy. Introduction and principles. Anal. Chem.
1989, 61, 132–138.
2. Scanning Electrochemical Microscopy; Mirkin, M. V.; Bard, A. J., Eds.; Marcel Dekker: New York, 2001.
3. Wittstock, G.; Burchardt, M.; Pust, S. E.; Shen, Y.; Zhao, C. Scanning electrochemical microscopy for direct imaging of reaction rates. Angew. Chem., Int. Ed.
2007, 46, 1584–1617.
4. Takahashi, Y.; Hirano, Y.; Yasukawa, T.; Shiku, H.; Yamada, H.; Matsue, T. Topographic, electrochemical, and optical images captured using standing approach mode scanning electrochemical/optical microscopy. Langmuir
2006, 22, 10299–10306.
5. Tan, C.; Rodríguez-López, J.; Parks, J. J.; Ritzert, N. L.; Ralph, D. C.; Abruña, H. D. Reactivity of monolayer chemical vapor deposited graphene imperfections studied using scanning electrochemical microscopy. ACS Nano
2012, 6, 3070–3079.
Cited by
7 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献