X-ray diffraction line profile analysis for defect study in Zr-2.5% Nb material
Author:
Publisher
Springer Science and Business Media LLC
Subject
Mechanics of Materials,General Materials Science
Link
http://link.springer.com/content/pdf/10.1007/BF02708487.pdf
Reference18 articles.
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4. Cheadle B A 1982Nucl. Technol. 57 231
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