1. L. Maisel and R. Glen (eds.), Thin Film Technology [Russian translation], Sov. Radio, Moscow (1978).
2. M. F. Kovtanyuk and Yu. A. Kontsevoi, Measurement of Parameters of Semiconductor Materials [in Russian], Metallurgiya, Moscow (1970).
3. V. K. Gavrilyuk, Yu. A. Kontsevoi, A. P. Oksanich, et al., Elektron. Promy., Issue 6(66) (1978).
4. L. S. Babadzhanov and A. R. Magradze, Metrologicheskaya Sluzhba SSSR, No. 3, 10 (1988).
5. R. A. Wesson, R. P. Pliskin, and W. A. Phillips, J. Appl. Phys.,38, 2455 (1967).