Precise interferometric measurement of the NiK-edge forward scattering amplitude with synchrotron X-rays

Author:

Bonse U.,Materlik G.

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference24 articles.

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2. Parratt, L.G.: Phys. Rev.95, 359 (1954)

3. James, R.W.: The Optical Principles of the Diffraction of X-rays. London: Bell, G. & Sons 1958

4. Suortti, P., Jennings, L.D.: Acta Cryst. A31 S 3, S 218 (1975)

5. Azároff, L.V.: X-ray Spectroscopy. New York: Mc Graw-Hill 1974

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