Author:
Jiang H. G.,Tong H. Y.,Xue X. M.,Ding B. Z.,Song Q. H.,Hu Z. Q.,Wang J. T.
Publisher
Springer Science and Business Media LLC
Subject
General Materials Science
Reference10 articles.
1. E. G. Colgan and J. W. Mayer, in ?Materials Research Society Symposium Proceedings?, Vol. 54: ?Thin films-interfaces and phenomena?, edited by R. J. Nemanich, P. S. Ho and S. S. Lau. (MRS, Pittsburgh, Pennsylvania, 1986) p. 121.
2. M. Takeyama and C. T. Liu, J. Mater. Res. 3 (1988) 665.
3. J. E. E. Baglin and F. M. D'heurle, in ?Ion beam surface layer analysis?, Vol. 1, edited by O. Meyer, G. Linker and F. Kappeler (Plenum Press, New York, 1976) p. 385.
4. E. G. Colgan, M. Nastasi and J. W. Mayer, J. Appl. Phys. 58 (1985) 4125.
5. E. Ma, M.-a. Nicolet and M. Nathan, ibid. 65 (1989) 2703.
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献