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Crack depth estimation by photoacoustic microscopy

  • Published:1986-03 Issue:1 Volume:64 Page:31-34
  • ISSN:0722-3277
  • Container-title:Zeitschrift f�r Physik B Condensed Matter
  • language:en
  • Short-container-title:Z. Physik B - Condensed Matter

Author:

Arnold W.,Hoffmann B.,Willems H.

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,General Materials Science

Reference16 articles.

1. Wong, Y.H.: In: Scanned image microscopy. Ash, E.A. (ed.), p. 247. New York: Academic Press 1980

2. Rosencwaig, A.: J. Phys. (Paris)44, C6?437 (1983)

3. Busse, G.: J. Phys. (Paris)44, C6?427 (1983)

4. Busse, G., Rosencwaig, A.: Appl. Phys. Lett.36, 815 (1980)

5. Wong, Y.H., Thomas, R.L., Hawkins, G.F.: Appl. Phys. Lett.32, 538 (1978)

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