Fine structure of defects in polyethylene used for power cable insulation observed by fluorescence microscopy-Reference-Cited by-同舟云学术

Fine structure of defects in polyethylene used for power cable insulation observed by fluorescence microscopy

Published:1993 Issue:1 Volume:28 Page:161-169
ISSN:0022-2461
Container-title:Journal of Materials Science
language:en
Short-container-title:JOURNAL OF MATERIALS SCIENCE

Author:

Moreau E.,Boudet A.,Mayoux C.,Laurent C.,Wright M.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00349047.pdf

Reference26 articles.

1. R. D. Naybour, IEEE Elect. Insul. Mag. 6 (5) (1990) 20.

2. J. H. Lawson and W. Vahlstrom, IEEE Trans. PAS-92 T72502-3 (1973) 824.

3. T. Miyashita, IEEE Trans. EI-6 (1971) 129.

4. T. Tabata, T. Fukada and Z. Iwata, in ?Proceedings of the IEEE Meeting and International Symposium on High Power Testing?, Portland (1971), 71TP545-PWR, 1370.

5. W. Vahlstrom Jr, IEEE Trans. PAS-91 71C42-PWR (1972) 1023.

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Physico-Chemical Characterization Techniques of Dielectrics;Dielectric Materials for Electrical Engineering;2013-03-07

2. Structural understanding of polyethylene crystal by retardance mapping technique;Journal of Molecular Structure;2010-06

3. Fluorescence confocal optical microscopy imaging of the grain boundary structure of zeolite MFI membranes made by secondary (seeded) growth;Journal of Membrane Science;2001-02-15

4. Simulations and experiments on the growth and microstructure of zeolite MFI films and membranes made by secondary growth;Microporous and Mesoporous Materials;2001-02

5. Confocal Optical Microscopy;Encyclopedia of Materials: Science and Technology;2001