Minimization of test time in system on chip using artificial intelligence-based test scheduling techniques-Reference-Cited by-同舟云学术

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Minimization of test time in system on chip using artificial intelligence-based test scheduling techniques

Published:2019-01-23 Issue:9 Volume:32 Page:5303-5312
ISSN:0941-0643
Container-title:Neural Computing and Applications
language:en
Short-container-title:Neural Comput & Applic

Author:

Chandrasekaran Gokul,Periyasamy Sakthivel,Panjappagounder Rajamanickam Karthikeyan

Publisher

Springer Science and Business Media LLC

Subject

Artificial Intelligence,Software

Link

http://link.springer.com/content/pdf/10.1007/s00521-019-04039-6.pdf

Reference41 articles.

1. Varatharajan R, Preethi AP, Manogaran G, Priyan MK, Sundarasekar R (2018) Stealthy attack detection in multi-channel multi-radio wireless networks. Multimed Tools Appl 77:18503–18526

2. Gandhi UD, Priyan MK, Varatharajan R, Manogaran G, Sundarasekar R, Kadu S (2018) HIoTPOT: surveillance on IoT devices against recent threats. Wirel Pers Commun 103:1179–1194

3. Priyan MK, Gandhi U, Varatharajan R, Manogaran G, Jidhesh R, Vadivel T (2017) Intelligent face recognition and navigation system using neural learning for smart security in internet of things. Cluster Comput. https://doi.org/10.1007/s10586-017-1323-4

4. Manogaran G, Vijayakumar V, Varatharajan R, Priyan MK, Sundarasekar R, Hsu CH (2017) Machine learning based big data processing framework for cancer diagnosis using hidden Markov model and GM clustering. Wirel Pers Commun 102:2099–2116

5. Varatharajan R, Manogaran G, Priyan MK, Sundarasekar R (2017) Wearable sensor devices for early detection of Alzheimer disease using dynamic time warping algorithm. Cluster Comput. https://doi.org/10.1007/s10586-017-0977-2

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