Modeling forces between the probe of atomic microscope and the scanning surface
Author:
Funder
Iran Nanotechnology Initiative Council
Publisher
Springer Science and Business Media LLC
Subject
Artificial Intelligence,Software
Link
http://link.springer.com/content/pdf/10.1007/s00521-018-3446-9.pdf
Reference14 articles.
1. Burton EF, Hillier J, Prebus A (1939) Report on the development of the electron supermicroscope at Toronto. Phys Rev 56:1171–1172
2. Yang Q (2007) Advanced controller design using neural networks for nonlinear dynamic systems with application to micro/nano robotics. University of Missouri–Rolla, MO, USA
3. Lapshin RV (1995) Analytical model for the approximation of hysteresis loop and its application to the scanning tunneling microscope. Rev Sci Instrum 66(9):4718–4730. https://doi.org/10.1063/1.1145314
4. Lapshin RV (2004) Feature-oriented scanning methodology for probe microscopy and nanotechnology. Nanotechnology 15(9):1135–1151
5. Feynman RP, Leighton R, Sands M (1964) The Feynman lectures on physics, vol II. Addison Wesley, Boston, pp 8–10
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