Abstract
AbstractPhotovoltaic (PV) system performance and reliability can be improved through the detection of defects in PV modules and the evaluation of their effects on system operation. In this paper, a novel system is proposed to detect and classify defects based on electroluminescence (EL) images. This system is called Fault Detection and Classification (FDC) and splits into four modules, which are (1) Image Preprocessing Module (IPM), (2) Feature Extraction Module (FEM), (3) Feature Selection Module (FSM), and (4) Classification Module (CM). In the first module (i.e., IPM), the EL images are preprocessed to enhance the quality of the images. Next, the two types of features in these images are extracted and fused together through FEM. Then, during FSM, the most important and informative features are extracted from these features using a new feature selection methodology, namely, Feature Selection-based Chaotic Map (FS-CM). FS-CM consists of two stages: filter stage using chi-square to initially select the most effective features and a modified selection stage using an enhanced version of Butterfly Optimization Algorithm (BOA). In fact, BOA is a popular swarm-based metaheuristic optimization algorithm that has only recently found success. While BOA has many benefits, it also has some drawbacks, including a smaller population and an increased likelihood of getting stuck in a local optimum. In this paper, a new methodology is proposed to improve the performance of BOA, called chaotic-based butterfly optimization algorithm. Finally, these selected features are used to feed the proposed classification model through CM. During CM, Hybrid Classification Model (HCM) is proposed. HCM consists of two stages, which are binary classification stage using Naïve Bayes (NB) and multi-class classification stage using enhanced multi-layer perceptron. According to the experimental results, the proposed system FDC outperforms the most recent methods. FDC introduced 98.2%, 89.23%, 87.2%, 87.9%, 87.55%, and 88.20% in terms of accuracy, precision, sensitivity, specificity, g-mean, and f-measure in the same order.
Funder
Nile Higher Institute for Engineering & Technology
Publisher
Springer Science and Business Media LLC
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