Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Modelling and Simulation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference39 articles.
1. Jeon, T.I., Grischkowsky, D.: Characterization of optically dense, doped semiconductors by reflection THz time domain spectroscopy. Appl. Phys. Lett. 72, 3032–3034 (1998)
2. Hashimshony, D., et al.: Characterization of the electrical properties and thickness of thin epitaxial semiconductor layers by THz reflection spectroscopy. J Appl. Phys. 90, 5778–5781 (2001)
3. Kiwa, T., et al.: Laser terahertz-emission microscope for inspecting electrical faults in integrated circuits. Opt. Lett. 28, 2058–2060 (2003)
4. Hasegawa, N., et al.: Remote identification of protrusions and dents on surfaces by terahertz reflectometry with spatial beam filtering and out-of-focus detection. Appl. Phys. Lett. 83, 3996–3998 (2003)
5. Yamashita, M., et al.: Noncontact inspection technique for electrical failures in semiconductor devices using a laser terahertz emission microscope. Appl. Phys. Lett. 93, 2008–2010 (2008)
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