Stochastic simulation of bimolecular reactions in vicinity of traps and applications to electron–hole recombination in 2D and 3D inhomogeneous semiconductors-Reference-Cited by-同舟云学术

Stochastic simulation of bimolecular reactions in vicinity of traps and applications to electron–hole recombination in 2D and 3D inhomogeneous semiconductors

Published:2017-02-25 Issue:2 Volume:16 Page:325-339
ISSN:1569-8025
Container-title:Journal of Computational Electronics
language:en
Short-container-title:J Comput Electron

Author:

Sabelfeld Karl K.,Kireeva Anastasiya

Funder

Russian Science Foundation

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Modelling and Simulation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s10825-017-0961-3.pdf

Reference22 articles.

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5. Kotomin, E., Kuzovkov, V.: Modern Aspects of Diffusion-Controlled Reactions. Volume 34: Cooperative Phenomena in Bimolecular Processes (Comprehensive Chemical Kinetics). Elsevier Science, Amsterdam (1996)

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