Efficient modeling approach for simulating multi-physics responses of an ion-sensitive field-effect transistor using artificial neural networks-Reference-Cited by-同舟云学术

Efficient modeling approach for simulating multi-physics responses of an ion-sensitive field-effect transistor using artificial neural networks

Published:2022-11-30 Issue: Volume: Page:
ISSN:1569-8025
Container-title:Journal of Computational Electronics
language:en
Short-container-title:J Comput Electron

Author:

Xie Jianan,Zhou Yuanguo^ORCID,Liang Bingyang,Ren Qiang,Javaid Fawad

Funder

National Natural Science Foundation of China

Natural Science Foundation of Shaanxi Province

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Modeling and Simulation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

https://link.springer.com/content/pdf/10.1007/s10825-022-01979-6.pdf

Reference18 articles.

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