Grundlagen der Röntgenoptik und Röntgenmikroskopie-Reference-Cited by-同舟云学术

Grundlagen der Röntgenoptik und Röntgenmikroskopie

Published: Issue: Volume: Page:1-133
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Container-title:Ergebnisse der Exakten Naturwissenschaften
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Author:

Hildenbrand G.

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/BFb0109453.pdf

Reference12 articles.

1. Marton, L., R. A. Schrack andR. C. Placious: Field emission X-ray microscope. Symp. on X-Ray Microscopy and Microradiography. Cambridge 1956.

2. Newberry, St. P., andS. E. Summers: A shorter focal length electrostatic objective for the shadow X-ray microscope. Symp. on X-Ray Microscopy and Microradiography. Cambridge 1956.

3. Nixon, W. C.: High-resolution X-ray projection microscopy. Proc. Roy. Soc. A232, 475–485 (1955).

4. Nixon, W. C.: Projection X-ray microscopy. Symp. on X-Ray Microscopy and Microradiography. Cambridge 1956.

5. Nixon, W. C.: Improved definition in X-ray diagnosis by high voltage projection microradiography. Symp. on X-Ray Microscopy and Microradiography. Cambridge 1956; Brit. J. Radiol.29, 657–662 (1956).

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