Scanning-electron-beam-excited charge collection micrography of GaAs lasers-Reference-Cited by-同舟云学术

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Scanning-electron-beam-excited charge collection micrography of GaAs lasers

Published:1968-03 Issue:2 Volume:3 Page:178-182
ISSN:0022-2461
Container-title:Journal of Materials Science
language:en
Short-container-title:J Mater Sci

Author:

Holt D. B.,Chase B. D.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00585486.pdf

Reference18 articles.

1. D. F. Kyser andD. B. Wittry, ?The Electron Microprobe?, edited by T. D. McKinley, K. F. J. Heinrich, and D. B. Wittry (Wiley, New York, 1966) pp. 691?714.

2. Idem, J. Appl. Phys. 35 (1964) 2439.

3. Idem,ibid 36 (1965) 1387.

4. D. B. Wittry,Appl. Phys. Letters 8 (1966) 142.

5. D. B. Wittry andD. F. Kyser,J. Phys. Soc. Japan 21 Suppl. (1966) 312.

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1. Electron-Beam-Induced Current and Cathodoluminescence;Springer Series in Optical Sciences;1998

2. Charge collection scanning electron microscopy;Journal of Applied Physics;1982-06

3. Assessment of Crystalline Perfection;Crystal Growth;1980

4. Transmission cathodoluminescence: A new SEM technique to study defects in bulk semiconductor samples;Applied Physics Letters;1979-04

5. Structure Analysis;Semiconducting Devices;1976

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