Publisher
Springer Science and Business Media LLC
Subject
Applied Mathematics,Computer Science Applications,Modelling and Simulation,Control and Systems Engineering
Reference21 articles.
1. I. F. Stowers. Optical cleanliness specifications and cleanliness verification. In Proceedings of the Optical Manufacturing and Testing III, SPIE, Denver, USA, vol. 3782, pp. 525–530, 1999.
2. R. L. Perry. A numerical evaluation of the correlation of surface cleanliness level and percent area coverage. In Proceedings of the Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II, SPIE, San Diego, USA, vol. 6291, Article number 62910L, 2006.
3. Q. Wu, W. Zou, D. Xu. Viewpoint planning for freeform surface inspection using plane structured light scanners. International Journal of Automation and Computing, vol. 13, no. 1, pp. 42–52, 2016.
4. G. Udupa, B. K. A. Ngoi, H. C. F. Goh, M. N. Yusoff. Defect detection in unpolished Si wafers by digital shearography. Measurement Science and Technology, vol. 15, no. 1, pp. 35–43, 2004.
5. M. Juuti, H. Tuononen, T. Prykäri, V. Kontturi, M. Kuosmanen, E. Alarousu, J. Ketolainen, R. Myllylä, K. E. Peiponen. Optical and terahertz measurement techniques for flat-faced pharmaceutical tablets: A case study of gloss, surface roughness and bulk properties of starch acetate tablets. Measurement Science and Technology, vol. 20, no. 1, pp. 015301, 2009.
Cited by
10 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献