1. Bridges F., Davies G., Robertson J., Stoneham A.M.: J. Phys. Condens. Matter2, 2875–2928 (1990); Ammerlaan C.A.J.: Landolt-Bornstein numerical Data and Functional Relationship in Science and Technology, New Series 111 (Madelung O., Schulz M., eds.),22b, pp.365–381. Berlin: Springer 1990.
2. Weil J.A.: Phys. Chem. Minerals10, 149–177 (1984); Weil J.A.: Phys. and Chem. of SiO2 and the Si−SiO2 Interface (Helms C.R., Deal B.E., eds.),2, pp.131–144. New York: Plenum 1993.
3. Ammerlaan C.I.J.: Landolt-Bornstein Numerical Data and Functional Relationships in Science and Technology, New Series 111 (Madelung O., Schulz M., eds.),22b, pp.117–206. Berlin: Springer 1990.
4. Spaeth J.-M., Niklas J.R., Bartram R.H.: Structural Analysis of Point Defects in Solids — An Introduction to Multiple Magnetic Resonance Spectroscopy. Berlin: Springer 1982.
5. Hayes W.: Crystals with the Fluorite Structure, chapters 4–6. OUP: Oxford 1974.