Author:
An Dawn,Choi Joo-Ho,Kim Nam Ho
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials
Reference31 articles.
1. A. K. S. Jardine, D. Lin and D. Banjevic, A review on machinery diagnostics and prognostics implementing conditionbased maintenance, Mechanical Systems and Signal Processing, 20 (7) (2006) 1483–1510.
2. D. An, N. H. Kim and J. H. Choi, Practical options for selecting data-driven or physics-based prognostics algorithms with reviews, Reliability Engineering and System Safety, 133 (2015) 223–236.
3. W. Nelson, Accelerated testing: Statistical models, test plans, and data analysis, NY: John Wiley & Sons (1990).
4. J. I. Park and S. J. Bae, Direct prediction methods on lifetime distribution of organic light-emitting diodes from accelerated degradation tests, IEEE Transactions on Reliability, 59 (1) (2010) 74–90.
5. J. R. Celaya, A. Saxena, S. Saha and K. F. Goebel, Prognostics of power MOSFETs under thermal stress accelerated aging using data-driven and model-based methodologies, Annual Conference of the Prognostics and Health Management Society, September 25–29, Montreal, Quebec, Canada (2011).
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