SEM investigation of surface topography induced by a new "3S" ion-beam sputtering method-Reference-Cited by-同舟云学术

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SEM investigation of surface topography induced by a new "3S" ion-beam sputtering method

Published:1987-08 Issue:8 Volume:6 Page:917-921
ISSN:0261-8028
Container-title:Journal of Materials Science Letters
language:en
Short-container-title:J Mater Sci Lett

Author:

Kowalski Z. W.,Łasisz S.,Smardz S.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF01729868.pdf

Reference9 articles.

1. O. AUCIELLO, in “Ion Bombardment Modification of Surfaces: Fundamentals and Applications”, edited by O. Auciello and R. Kelly (Elsevier, Amsterdam, 1984) pp. 435–62.

2. B. A. BANKS, NASA TM 81721 (1981) p. 1.

3. Z. W. KOWALSKI,J. Mater. Sci. 20 (1985) 1521.

4. I. H. WILSON, J. BELSON and O. AUCIELLO, in “Ion Bombardment Modification of Surfaces: Fundamentals and Applications”, edited by O. Auciello and R. Kelly (Elsevier, Amsterdam, 1984) pp. 225–77.

5. R. S. ROBINSON and S. M. ROSSNAGEL,ibid., pp. 299–322.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ion-bombardment modification of surface morphology of solids: a new direction in materials science;Journal of Materials Science Letters;1988-08

2. Different aspects of surface morphology modification of ion-beam sputtered aluminium investigated by SEM and a profilograph;Journal of Materials Science Letters;1988-07

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