Schichtdickenbestimmung an dünen Edelmetallschichten durch Röntgenfluorescenzanalyse nach einer eichprobenfreien Emissionsmethode-Reference-Cited by-同舟云学术

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Schichtdickenbestimmung an dünen Edelmetallschichten durch Röntgenfluorescenzanalyse nach einer eichprobenfreien Emissionsmethode

Published:1966-06 Issue:2 Volume:222 Page:178-189
ISSN:0016-1152
Container-title:Fresenius' Zeitschrift für analytische Chemie
language:de
Short-container-title:Z. Anal. Chem.

Author:

Diehl W.

Publisher

Springer Science and Business Media LLC

Subject

Clinical Biochemistry,General Materials Science,General Medicine,Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF00501332.pdf

Reference8 articles.

1. Birks, L. S.: X-ray spectrochemical analysis. New York: Intersci. Publ. 1959.

2. Ebel, H.: Z. Metallk. 56, 802 (1965).

3. Hirokawa, K., T. Shimanuki u. H. Gotô: diese Z. 190, 309 (1962).

4. Hodgman, C. D.: Handbook of chemistry and physics, 43. Edit., p. 2718–2723. Cleveland 1961.

5. Liebhafsky, H. A., and P. D. Zemany: Anal. Chem. 28, 455 (1956); vgl. diese Z. 154, 437 (1957).

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Determination of brass composition and plating thickness on brass-plated wire and cord by x-ray fluorescence spectrometry;X-Ray Spectrometry;1983-04

2. A rapid determination of brass composition and plating weight on brass-plated steel wire and cord by X-ray fluorescence spectrometry;Talanta;1980-08

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