Electron spin resonance and some electrical and optical properties of GeO2/SiO x thin films-Reference-Cited by-同舟云学术

Electron spin resonance and some electrical and optical properties of GeO2/SiO x thin films

Published:1984-05 Issue:5 Volume:19 Page:1505-1509
ISSN:0022-2461
Container-title:Journal of Materials Science
language:en
Short-container-title:J Mater Sci

Author:

Arshak K. I.,Al-Ramadhan F. A. S.,Hogarth C. A.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00563045.pdf

Reference6 articles.

1. M. H. Brodsky, R. S. Title, K. Weiser andG. D. Pettit,Phys. Rev. B1 (1971) 2632.

2. A. J. Lewis, G. A. N. Connell, W. Paul, I. R. Pawlik andR. J. Temkin, Proceedings of the Conference on Tetrahedrally Bonded Amorphous Semiconductors, Yorktown Heights, New York, March 1974 (American Physics Society and IBM, 1974) p.27.

3. P. A. Timson andC. A. Hogarth,Thin Solid Films 10 (1912) 321.

4. C. A. Hogarth andL. A. Wright, Proceedings of the 9th International Conference on the Physics of Semiconductors, Moscow, July 1968 (Acad. Sci., USSR, 1968) Vol. II, p. 1274.

5. J. Tauc,Phys. Status Solidi 15 (1966) 627.

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