1. LNCS;M. Alemán-Flores,2010
2. Alvarez, L., Esclarín, J., Trujillo, A.: A model based edge location with subpixel precision. In: Proceedings IWCVIA 03: International WorkShop on Computer Vision and Image Analysis (Las Palmas de Gran Canaria, Spain), pp. 29–32 (2003)
3. Alvarez, L., Gomez, L., Sendra, R.: An algebraic approach to lens distortion by line rectification. J. Math. Imaging Vis. 35(1), 36–50 (2009)
4. Brakhage, P., Notni, G., Kowarschik, R.: Image aberrations in optical three-dimensional measurement systems with fringe projection. Appl. Opt. 3217–3223 (2004)
5. Bräuer-Burchardt, C., Heinze, M., Munkelt, C., Kühmstedt, P., Notni, G.: Distance dependent lens distortion variation in 3D measuring systems using fringe projection. In: BMVC 2006, pp. 327–336 (2006)