Robust Fitting of Circle Arcs-Reference-Cited by-同舟云学术

Robust Fitting of Circle Arcs

Published:2010-12-22 Issue:2 Volume:40 Page:147-161
ISSN:0924-9907
Container-title:Journal of Mathematical Imaging and Vision
language:en
Short-container-title:J Math Imaging Vis

Author:

Ladrón de Guevara I.,Muñoz J.,de Cózar O. D.,Blázquez E. B.

Publisher

Springer Science and Business Media LLC

Subject

Applied Mathematics,Geometry and Topology,Computer Vision and Pattern Recognition,Condensed Matter Physics,Modelling and Simulation,Statistics and Probability

Link

http://link.springer.com/content/pdf/10.1007/s10851-010-0249-8.pdf

Reference32 articles.

1. Shunmugam, M.S.: Criteria for computer-aided form evaluation. J. Eng. Ind. 113, 233–238 (1991)

2. Van-Ban, L., Lee, D.T.: Out-of-roundness problem revisited. IEEE Trans. Pattern Anal. Mach. Intell. 13, 217–23 (1991)

3. Ventura, J.A., Yeralan, S.: The minimax centre estimation problem for automated roundness inspection. Eur. J. Oper. Res. 41, 64–72 (1989)

4. Yeralan, S., Ventura, J.A.: Computerized roundness inspection. Int. J. Prod. Res. 26, 1921–1935 (1988)

5. Schalk, P., Ofner, R., O’Leary, P.: Pipe eccentricity measurement using laser triangulation. Image Vis. Comput. 25, 1194–1203 (2007)

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