The Effect of Annealing Temperature on the Plasma Edge in Reflectance Spectra of Al/Al2O3 Composites Synthesized by Thermal Oxidation of Aluminum Thin Films-Reference-Cited by-同舟云学术

The Effect of Annealing Temperature on the Plasma Edge in Reflectance Spectra of Al/Al2O3 Composites Synthesized by Thermal Oxidation of Aluminum Thin Films

Published:2020-07-03 Issue:6 Volume:15 Page:1959-1966
ISSN:1557-1955
Container-title:Plasmonics
language:en
Short-container-title:Plasmonics

Author:

Kayed Kamal^ORCID,Alberni Lubna

Publisher

Springer Science and Business Media LLC

Subject

Biochemistry,Biophysics,Biotechnology

Link

http://link.springer.com/content/pdf/10.1007/s11468-020-01225-4.pdf

Reference26 articles.

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3. Mohammadi MR (2014) Semiconductor TiO2-Al2O3 thin film gas sensors derived from aqueous particulate sol-gel process. Mater Sci Semicond Process 27:711–718

4. Liang Z, Bi Z, Gao K, Fu Y, Guan P, Feng X, Chai Z, Xu G, Xu X (2019) Interface modification via Al 2 O 3 with retarded charge recombinations for mesoscopic perovskite solar cells fabricated with spray deposition process in the air. Appl Surf Sci 463:939–946

5. Baek Y, Lim S, Kim LH, Park S, Lee SW, Oh TH, Kim SH, Park CE (2016) Al2O3/TiO2 nanolaminate gate dielectric films with enhanced electrical performances for organic field-effect transistors. Organic Electronics 28:139–146

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