1. V.K. Agrawal and A.S.F. Fung, ?Multiple Fault Testing of Large Circuits by Single Fault Test Sets,? IEEE Transactions on Computers, Vol. 30, pp. 855?865, November 1981.
2. J.L.A. Hughes and E.J. McCluskey, ?Multiple Stuck-at Fault Coverage of Single Fault Test Sets,? in Proceedings of International Test Conference, September 1986, pp. 368?374.
3. J. Jacob and N.N. Biswas, ?GTBD Faults and Lower Bounds on Multiple Fault Coverage of Single Fault Test Sets,? in Proceedings of International Test Conference, September 1987, pp. 849?855.
4. R.A. Marlett, ?EBT: A Comprehensive Test Generation Technique for Highly Sequential Circuits,? in Proceedings of the 15th Design Automation Conference, June 1978, pp. 335?339.
5. R.A. Marlett, ?An Efficient Test Generation System for Sequential Circuits,? in Proceedings of the 23rd Design Automation Conference, June 1986, pp. 250?256.