Evaluation of Low-Cost Thermal Laser Stimulation for Data Extraction and Key Readout

Author:

Krachenfels ThiloORCID,Lohrke Heiko,Seifert Jean-Pierre,Dietz Enrico,Frohmann Sven,Hübers Heinz-Wilhelm

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Building and Construction

Reference15 articles.

1. Nedospasov D, Seifert J P, Helfmeier C, Boit C (2013) Invasive PUF analysis. In: 2013 Workshop on fault diagnosis and tolerance in cryptography (FDTC). IEEE, pp 30–38

2. Lohrke H, Tajik S, Krachenfels T, Boit C, Seifert J P (2018) Key Extraction Using Thermal Laser Stimulation. IACR Transactions on Cryptographic Hardware and Embedded Systems, pp 573–595

3. Kiyan T, Lohrke H, Boit C (2018) Comparative Assessment of Optical Techniques for Semi-Invasive SRAM Data Read-out on an MSP430 Microcontroller. In: ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis. ASM International, pp 266–271

4. Beaudoin F, Desplats R, Perdu P, Lewis D (2001) Implementing Thermal Laser Stimulation in a Failure Analysis Laboratory. In: ISTFA 2001: Proceedings of the 27th International Symposium for Testing and Failure Analysis. ASM International, pp 151–160

5. Boit C, Helfmeier C, Nedospasov D, Fox A (2013) Ultra high precision circuit diagnosis through seebeck generation and charge monitoring. In: Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, pp 17–21

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