1. Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, Briggs, D. and Seah, M., Eds., New York: Wiley, 1983. Translated under the title Analiz poverkhnosti metodami ozhe-i rentgenovskoi fotoelektronnoi spektroskopii, Moscow: Mir, 1987.
2. Osnovy analiticheskoi khimii (Basic Analytical Chemistry), vol. 2: Metody khimicheskogo analiza (Methods of Chemical Analysis), 2nd ed., Zolotov, Yu.A., Ed., Moscow: Vysshaya Shkola, 1999, p. 258.
3. Kim, K.S., Baitinger, W.E., Amy, T.W., and Winograd, N., Relat. Phenom., 1974, vol. 5, p. 351.
4. Kelly, R., J. Vac. Sci. Technol., 1982, vol. 21, no.3, p. 778.
5. Alov, N.V., Petrov, G.B., and Grigor’ev, G.A., Dokl. Akad. Nauk SSSR, 1987, vol. 294, no.3, p. 623.