Demand and Challenges for Wafer-Level Chip-Scale Analog and Power Packaging

Author:

Qu Shichun,Liu Yong

Publisher

Springer New York

Reference21 articles.

1. Liu, Y.: Reliability of power electronic packaging. International Workshop on Wide-Band-Gap Power Electronics, Hsingchu, April (2013)

2. Liu, Y.: Power electronics packaging. Seminar on Micro/Nanoelectronics System Integration and Reliability, Delft, April (2014)

3. Kinzer, D.: (Keynote) Trends in analog and power packaging. EuroSimE, Delft, April (2009)

4. Liu, Y., Kinzer, D.: (Keynote) Challenges of power electronic packaging and modeling. EuroSimE, Linz, April (2011)

5. Liu, Y.: (Keynote) Trends of analog and power electronic packaging development. ICEPT, Guilin, August, (2012)

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