Author:
Inoue Y.,Miyamoto A.,Nakano E.,Takahashi T.,Tauchi T.,Teramoto Y.,Abe K.,Abe T.,Adachi I.,Adachi K.,Aoki M.,Aoki M.,Enomoto R.,Emi K.,Fujii H.,Fujii K.,Fujii T.,Fujimoto J.,Fujiwara N.,Hirano H.,Howell B.,Hayashii H.,Iida N.,Ikeda H.,Itami S.,Itoh R.,Iwasaki H.,Iwasaki M.,Kajikawa R.,Kaneyuki K.,Kato S.,Kawabata S.,Kichimi H.,Kobayashi M.,Koltick D.,Levine I.,Mamada H.,Miyabayashi K.,Muramatsu K.,Nagai K.,Nakabayashi K.,Nakamura M.,Noguchi S.,Nitoh O.,Ochi A.,Ochiai F.,Ohishi N.,Ohnishi Y.,Ohshima Y.,Okuno H.,Okusawa T.,Shibata E.,Sugiyama A.,Sugiyama H.,Suzuki S.,Takahashi K.,Tanimori T.,Tomoto M.,Tsukamoto T.,Tsumura T.,Uno S.,Watanabe Y.,Yamamoto A.,Yamauchi M.
Publisher
Springer Science and Business Media LLC
Subject
Physics and Astronomy (miscellaneous),Engineering (miscellaneous)