High resolution auger electron spectroscopy for materials characterization-Reference-Cited by-同舟云学术

High resolution auger electron spectroscopy for materials characterization

Published:1987-01 Issue:1-6 Volume:91 Page:321-345
ISSN:0026-3672
Container-title:Mikrochimica Acta
language:en
Short-container-title:Mikrochim Acta

Author:

Hofmann Siegfried

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF01199509.pdf

Reference79 articles.

1. H. W. Werner, R. P. H. Garten,Rep. Progr. Phys. 1984,47, 221.

2. S. Hofmann,Surf. Interface Anal. 1986,9, 3.

3. R. Holm, S. Storp, Methoden zur Untersuchung von Oberfl�chen, in:Ullmanns Encycl. d. techn. Chemie, Vol. 5 (H. Kelker, ed.), Verlag Chemie, Weinheim, 1980, p. 519.

4. D. Briggs, M. P. Seah (eds.),Practical Surface Analysis by Auger and Photoelectron Spectroscopy, Wiley, Chichester, 1983.

5. S. Hofmann, Auger Electron Spectroscopy, in:Wilson & Wilson's Comprehensive Analytical Chemistry, Vol. IX (G. Svehla, ed.), Elsevier, Amsterdam, 1979, p. 89.

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