1. A. M. Valitov and G. I. Shilov, Apparatus and Techniques for Monitoring the Thickness of Coatings in Russian, Mashinostroenie, Leningrad (1970).
2. N. Harrick, Internal Reflection Spectroscopy [Russian translation], Mir, Moscow (1970).
3. P. Yang, X. Meng, Z. Zang, B. Jing, J. Yuan, and W. Yang, Anal. Chem., 77, 1068–1074 (2005).
4. H. G. Tompkins, Appl. Spectrosc., 28, 335–341 (1974).
5. O. N. Tretinnikov and R.G. Zhbankov, Macromolecules, 37, 3543–3545 (2004).